Produttore elettronici | Il numero della parte | Scheda tecnica | Spiegazioni elettronici |
Abracon Corporation |
AXS-1147-02-02
|
419Kb / 1P |
CRYSTAL TEST & BURN IN SOCKET
08.21.09 |
AXS-1155-04-01
|
410Kb / 1P |
CRYSTAL TEST & BURN-IN SOCKET
07.10.09 |
AXS-7050-06-13
|
411Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.13.09 |
Aries Electronics, Inc. |
10010
|
1Mb / 2P |
Universal PLCC ZIF Test Socket
|
10012
|
529Kb / 1P |
Universal PLCC ZIF Test Socket
|
Abracon Corporation |
AXS-7550-06-03
|
412Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.13.09 |
AXS-2520-04-01
|
403Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.10.09 |
Aries Electronics, Inc. |
10002HT
|
716Kb / 1P |
High-Temp 250째C Universal ZIF DIPBurn-in & Test Socket ??300째C Special Order
|
10004HT
|
1Mb / 2P |
High-Temp PGA ZIF Test & Burn-in Socket for Footprints on Std 8x8 to 21x21 Grid
|
24-3551-10
|
535Kb / 1P |
Universal Zero-Insertion-Force DIP Test Socket
|