| Produttore elettronici | Il numero della parte | Scheda tecnica | Spiegazioni elettronici |

Maxim Integrated Produc...
|
MAX9633 |
808Kb/12P |
Improved Reliability Rev 4; 1/15 |

Naina Semiconductor ltd...
|
NPS35 |
151Kb/2P |
Improved glass passivation for high reliability |
| NPS40 |
153Kb/2P |
Improved glass passivation for high reliability |
| NPSS40 |
152Kb/2P |
Improved glass passivation for high reliability |

Nell Semiconductor Co.,...
|
50PTS |
1Mb/7P |
Improved glass passivation for high reliability |

Naina Semiconductor ltd...
|
NPS20 |
157Kb/2P |
Improved glass passivation for high reliability |
| NPIS20 |
175Kb/2P |
Improved glass passivation for high reliability |
| NPSS20 |
170Kb/2P |
Improved glass passivation for high reliability |
| NPIS25 |
172Kb/2P |
Improved glass passivation for high reliability |
| NPIS40 |
188Kb/2P |
Improved glass passivation for high reliability |
| NPIS35 |
179Kb/2P |
Improved glass passivation for high reliability |
| NPS25 |
156Kb/2P |
Improved glass passivation for high reliability |
| NPSS25 |
160Kb/2P |
Improved glass passivation for high reliability |
| NPSS35 |
153Kb/2P |
Improved glass passivation for high reliability |

AVX Corporation
|
F9H |
417Kb/3P |
High Temperature 150쨘C, Improved Reliability J-Lead |

Japan Aviation Electron...
|
ES9 |
180Kb/6P |
Improved contact reliability with a 2-point contact structure. |

MKS Instruments.
|
AA02A |
270Kb/4P |
All-digital architecture and improved thermal management provides better long-term stability, improved accuracy and increased reliability |

TT Electronics.
|
PWC |
672Kb/4P |
improved working voltage |

Silicon Laboratories
|
TS6001 |
1Mb/13P |
Improved Electrical Performance |

Samsung semiconductor
|
IRFS640A |
304Kb/6P |
Improved gate charge |