| Produttore elettronici | Il numero della parte | Scheda tecnica | Spiegazioni elettronici |

CML Microcircuits
|
EV9902A |
484Kb/23P |
Measures Bit Error Rate |

TEKTRONIX, INC.
|
BSX |
1Mb/38P |
Bit Error Rate Tester |

Dallas Semiconductor
|
DS2172 |
213Kb/21P |
Bit Error Rate Tester BERT |

Maxim Integrated Produc...
|
DS2172 |
180Kb/22P |
Bit Error Rate Tester (BERT) 101000 |

Dallas Semiconductor
|
DS21372 |
214Kb/21P |
3.3V Bit Error Rate Tester BERT |

Maxim Integrated Produc...
|
DS21372 |
180Kb/22P |
3.3V Bit Error Rate Tester (BERT) 101000 |

Agilent(Hewlett-Packard...
|
N2101B |
255Kb/4P |
Bit Error Ratio Tester |

Texas Instruments
|
TLC5540 |
879Kb/24P |
8-Bit Resolution Differential Linearity Error Integral Linearity Error |

Union Semiconductor, In...
|
UM488 |
363Kb/17P |
Enhanced Slew-Rate Limiting Facilitates Error-Free Data Transmission |

fujitsu semiconductor
|
MB1426 |
734Kb/15P |
16 BIT ERROR CHECKING & CORRECTION |

Maxim Integrated Produc...
|
MAX17135EVKIT |
2Mb/12P |
Measures Remote Diode Temperature Rev 1; 1/12 |
| MAX34407 |
445Kb/17P |
Measures Both Current and Voltage Rev 0; 11/14 |
| MAX6654EVSYS |
151Kb/5P |
Measures and Displays Remote Sensor Rev 0; 5/01 |

Texas Instruments
|
SN54LS630 |
352Kb/9P |
16-BIT PARALLEL ERROR DETECTION AND CORRECTION CIRCUITS |

Dynex Semiconductor
|
MA31755 |
134Kb/13P |
16-Bit Feedthrough Error Detection & Correction Unit EDAC |

Amphenol Corporation
|
T10 |
103Kb/8P |
Measures differential, gage pressure, or vacuum |

Maxim Integrated Produc...
|
MAX1668EVSYS |
1Mb/7P |
Measures and Displays Remote and Internal Rev 0; 12/00 |

Intersil Corporation
|
HD-4702 |
80Kb/8P |
CMOS Programmable Bit Rate Generator June 1998 |
| HD-4702 |
128Kb/8P |
CMOS Programmable Bit Rate Generator |

National Semiconductor ...
|
DP8406 |
225Kb/14P |
32-Bit Parallel Error Detection and Correction Circuit |