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CLRC63201T/0FE Scheda tecnica(PDF) 148 Page - NXP Semiconductors |
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CLRC63201T/0FE Scheda tecnica(HTML) 148 Page - NXP Semiconductors |
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148 / 163 page ![]() Philips Semiconductors Product Specification Rev. 3.0; May 2003 Multiple Protocol Contactless Reader IC CL RC632 148 Confidential 21.6 Examples of I •CODE1 Analog- and Digital Test Signals Fig. 17 shows the answer of an I •CODE1 Label IC to a unselected read command using the Qclock receiving path. RX –Reference is given to show the Manchester modulated signal at the RX pin. This signal is demodulated and amplified in the receiver circuitry VRXAmpQ shows the amplified side band signal having used the Q- Clock for demodulation. The signals VCorrDQ and VCorrNQ generated in the correlation circuitry are evaluated and digitised in the evaluation and digitizer circuitry. VEvalR and VEvalL show the evaluation signal of the right and left half bit. Finally, the digital test-signal S_data shows the received data which is send to the internal digital circuit and S_valid indicates that the received data stream is valid. VrxAmpQ VcorrDQ VcorrNQ VevalR VevalL Sdata SValid Receiving path Q-Clock 50 µsec/Dev. 500 µsec/Dev. Figure 24. Receiving path Q-Clock |
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