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ST7263BEx Scheda tecnica(PDF) 184 Page - STMicroelectronics |
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ST7263BEx Scheda tecnica(HTML) 184 Page - STMicroelectronics |
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184 / 186 page ![]() Revision history ST7263Bxx 184/186 Doc ID 7516 Rev 8 17 Revision history Table 89. Document revision history Date Revision Changes 27-May-05 3 New revision created by merging 32K Flash and non-32K Flash datasheets together. Memory Map, Figure 7, expanded to handle all devices and memory sizes. Operating conditions with LVD values modified, Section 13.3.1: Operating conditions with low voltage detector (LVD). Supply current characteristics values and notes updated, Section 13.4: Supply current characteristics. IDD Run and Wait graphs replaced, Figure 55 and Figure 56 on page 143. Control timing characteristics modified, Section Table 62.: Control timing characteristics. Flash memory table notes and tPROG typical value updated, Section 13.6.1: Flash memory. Notes added for I/O Port Pin Characteristics table, Section Table 70.: General characteristics. Note for RPU modified, removing reference to data characterization, Section Table 70. IPU and RPU graphs added, Figure 61 and Figure 62 on page 150. Notes updated for USB low speed electrical characteristics. Output voltage/current graphs added, Figures Figure 63.-Figure 72.Thermal Characteristics added for SO24 and TQFP48 packages, Section 14.2: Thermal characteristics. Important note added for OPT 3 Option Byte (LVD), Section 15.1: Option byte. Supported Part Numbers table updated with full sales type codes, Table 86. Option List updated with all device options. Important notes updated with ‘USB behavior with LVD disabled’, Section 16.3: USB behavior with LVD disabled. Clock block diagram redrawn, Figure 18 on page 36. DFU added to title and features list. Removed unnecessary notes related to Typical Values (already mentioned in Section 13.1.2: Typical values) in electrical characteristic tables sections: Section 13.3.1, Section 13.4, Section 13.6.1, Section Table 70., Section Table 72. and Section 13.11. Added note for max values in ADC Accuracy, Section 13.11. Static Latch Up (LU) class tested only for TA=25°C, Section : Static latchup (LU) 19-Sep-05 4 Flash memory minimum data retention increased to 40 years, Section 13.6.1: Flash memory AF bit text modified concerning SCL, I2C chapter Section 11.5.7: Register description Reference made to the Flash Programming Reference Manual for Flash timing values Reset pulse generated by WDG changed to 30 µs, Section 11.1: Watchdog timer (WDG) Modified text in Section 11.3: Serial communications interface (SCI), adding Parity error as an interrupt Added ECOPACK information in Section 14: Package characteristics Modified IS value and corresponding note in Section Table 70.: General characteristics 06-Apr-06 5 32K and 8K QFN40 Packages added 4K SO24 Package added TQFP package renamed to LQFP |
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