Description
The ATF1504AS is a high-performance, high-density complex programmable logic device (CPLD) that utilizes Atmel’s proven electrically-erasable memory technology. With 64 logic macrocells and up to 68 inputs, it easily integrates logic from several TTL, SSI, MSI, LSI and classic PLDs. The ATF1504AS’s enhanced routing switch matrices increase usable gate count and the odds of successful pin-locked design modifications.
The ATF1504AS has up to 68 bi-directional I/O pins and four dedicated input pins, depending on the type of device package selected. Each dedicated pin can also serve as a global control signal, register clock, register reset or output enable. Each of these control signals can be selected for use individually within each macrocell.

Features
• High-density, High-performance, Electrically-erasable Complex Programmable Logic Device
   – 64 Macrocells
   – 5 Product Terms per Macrocell, Expandable up to 40 per Macrocell
   – 44, 68, 84, 100 Pins
   – 7.5 ns Maximum Pin-to-pin Delay
   – Registered Operation up to 125 MHz
   – Enhanced Routing Resources
• In-System Programmability (ISP) via JTAG
• Flexible Logic Macrocell
   – D/T/Latch Configurable Flip-flops
   – Global and Individual Register Control Signals
   – Global and Individual Output Enable
   – Programmable Output Slew Rate
   – Programmable Output Open Collector Option
   – Maximum Logic Utilization by Burying a Register with a COM Output
• Advanced Power Management Features
   – Automatic µA Standby for “L” Version
   – Pin-controlled 1 mA Standby Mode
   – Programmable Pin-keeper Circuits on Inputs and I/Os
   – Reduced-power Feature per Macrocell
• Available in Commercial and Industrial Temperature Ranges
• Available in 44-, 68-, and 84-lead PLCC; 44- and 100-lead TQFP; and 100-lead PQFP
• Advanced EE Technology
   – 100% Tested
   – Completely Reprogrammable
   – 10,000 Program/Erase Cycles
   – 20-year Data Retention
   – 2000V ESD Protection
   – 200 mA Latch-up Immunity
• JTAG Boundary-scan Testing to IEEE Std. 1149.1-1990 and 1149.1a-1993 Supported
• PCI-compliant
• 3.3V or 5.0V I/O Pins
• Security Fuse Feature
• Green (Pb/Halide-fee/RoHS Compliant) Package Options

Enhanced Features
• Improved Connectivity (Additional Feedback Routing, Alternate Input Routing)
• Output Enable Product Terms
• Transparent – Latch Mode
• Combinatorial Output with Registered Feedback within Any Macrocell
• Three Global Clock Pins
• ITD (Input Transition Detection) Circuits on Global Clocks, Inputs and I/O
• Fast Registered Input from Product Term
• Programmable “Pin-keeper” Option
• VCC Power-up Reset Option
• Pull-up Option on JTAG Pins TMS and TDI
• Advanced Power Management Features
   – Edge-controlled Power-down “L”
   – Individual Macrocell Power Option
   – Disable ITD on Global Clocks, Inputs and I/O