GENERAL DESCRIPTION
The ADGM1144 is a wideband, single-pole, four-throw (SP4T)
switch, fabricated using Analog Devices, Inc., microelectromechanical
system (MEMS) switch technology. This technology enables a
small form factor, wide RF bandwidth, highly linear, low insertion
loss switch that is operational down to 0 Hz/DC, making it an ideal
solution for a wide range of RF and precision equipment switching
needs.
An integrated driver chip generates a high voltage to an electrostatically
actuate switch that can be controlled by a parallel interface
and a serial peripheral interface (SPI). All four switches are independently
controllable.
The device is packaged in a 24-lead, 5 mm × 4 mm × 1.0 mm land
grid array package (LGA).
The ADGM1144 has integrated 10 MΩ resistors required for floating
node avoidance. The presence of these integrated 10 MΩ resistors
saves board space and eliminates floating nodes on the switch. To
ensure optimum operation of the ADGM1144, refer to the Critical
Operational Requirements section.
Throughout this data sheet, multifunction pins, such as IN1/SDI, are
referred to either by the entire pin name or by a single function of
the pin, for example IN1, when only that function is relevant.

FEATURES
► Fully operational from DC to 18 GHz (typical)
► RF performance characteristics
► Insertion loss: −1.7 dB (typical) at 16 GHz
► Isolation: −18.5 dB (typical) at 6 GHz
► IIP3: 73 dBm (typical)
► RF power: 33 dBm (maximum)
► On resistance: 1.9 Ω (typical)
► DC current handling: 200 mA
► Actuation lifetime: 200 million cycles (minimum)
► On switching time: 200 μs (typical)
► Integrated 3.3 V driver for simple control with parallel and SPI
interface
► Independently controllable switches
► Space saving integrated passive components
► Eliminates floating nodes on the switch
► 5 mm × 4 mm × 1.0 mm, 24-lead land grid array package
► Temperature range: −40°C to +85°C
► Switch position is unknown with no supply voltage

APPLICATIONS
► Automatic test equipment (ATE) load and probe boards
► DC with high speed digital testing
► Relay replacements
► RF test instrumentation
► ATE: RF, digital, and mixed signals
► RF wireless communications
► High performance RF switching