Features
• Electrically screened to SMD 5962-17208
• Acceptance tested to 100krad(Si) (HDR) and to 50krad(Si)
(LDR) wafer-by-wafer
• Integrated 5-bit to 32-channel decoder
• Integrated level shifting circuit
• High collector current outputs
• High voltage outputs
• Grounded metal lid
• Full military temperature range operation
- TA = -55°C to +125°C
- TJ = -55°C to +150°C
• Radiation tolerance
- HDR (50rad(Si)/s to 300rad(Si)/s) . . . . . . . . . 100krad(Si)
- LDR (0.01rad(Si)/s) . . . . . . . . . . . . . . . . . . . . . . . 50krad(Si)
• SEE hardness
- No SEB/SEL LETTH, VCE = 33V . . . . . . . 86.4MeV•cm2/mg