1 Features
• Low propagation delay: 800 ps
• Low overdrive dispersion: 350 ps
• Quiescent current: 12.1 mA
• High toggle frequency: 1.5 GHz / 3.0 Gbps
• Narrow pulse width detection capability: 600 ps
• LVDS output
• Supply range: 2.4 V to 5.5 V
• Input common-mode range extends 200 mV
beyond both rails
• Low input offset voltage: ±5 mV
• Single and dual channel options

2 Applications
• Distance sensing in LIDAR
• Time-of-Flight sensors
• High speed trigger function in oscilloscope and
logic analyzer
• High speed differential line receiver
• Drone vision

3 Description
The TLV3604, TLV3605 (single channel), and
TLV3607 (dual channel) are 800-ps, high-speed
comparators with LVDS outputs and rail-to-rail inputs.
These features, along with an operating voltage range
of 2.4 V to 5.5 V and a high toggle frequency
of 3 Gbps, make them well suited for LIDAR,
clock and data recovery applications, and test and
measurement systems.
Likewise, the TLV3604, TLV3605 and TLV3607 have
strong input overdrive performance of 350 ps and are
able to detect narrow pulse widths of just 600 ps.
This combination of low variation in propagation delay
due to input overdrive and the ability to detect narrow
pulses improve system performance and extend
distance range in Time-of-Flight (ToF) applications.
The Low-Voltage-Differential-Signal (LVDS) output of
the TLV3604, TLV3605, and TLV3607 also helps
increase data throughput and optimizes power
consumption. The complementary outputs reduce
EMI by suppressing common mode noise on each
output. The LVDS output is designed to drive and
interface directly with downstream devices that accept
a standard LVDS input, such as high-speed FPGAs
and CPUs.
The TLV3604 is in a tiny 6 pin SC-70 package,
which makes it easier for space sensitive applications
such as an optical sensor module. The TLV3605
(single) and TLV3607 (dual) maintain the same
performance as the TLV3604, and offer adjustable
hysteresis control, shutdown, and latching features in
12 pin QFN and 16 pin WQFN packages, making
them excellent choices for test and measurement
applications.