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SCAN90004 Scheda tecnica (PDF) - Texas Instruments

SCAN90004 Datasheet PDF - Texas Instruments
Il numero della parte SCAN90004
Scarica  SCAN90004 Scarica
Grandezza file   521.91 Kbytes
Page   17 Pages
Produttore elettronici  TI2 [Texas Instruments]
Homepage  https://www.ti.com
Logo TI2 - Texas Instruments
Spiegazioni elettronici SCAN90004 4-Channel LVDS Buffer/Repeater with Pre-Emphasis

SCAN90004 Datasheet (PDF)

Go To PDF Page Scarica Scheda tecnica
SCAN90004 Datasheet PDF - Texas Instruments

Il numero della parte SCAN90004
Scarica  SCAN90004 Click to download

Grandezza file   521.91 Kbytes
Page   17 Pages
Produttore elettronici  TI2 [Texas Instruments]
Homepage  https://www.ti.com
Logo TI2 - Texas Instruments
Spiegazioni elettronici SCAN90004 4-Channel LVDS Buffer/Repeater with Pre-Emphasis

SCAN90004 Scheda tecnica (HTML) - Texas Instruments


SCAN90004 Dettagli del prodotto

1FEATURES
2• 1.5 Gbps Maximum Data Rate Per Channel
• Configurable Pre-emphasis Drives Lossy
Backplanes and Cables
• Low Output Skew and Jitter
• LVDS/CML/LVPECL Compatible Input, LVDS
Output
• On-chip 100Ω Input and Output Termination
• 12 kV ESD Protection on LVDS Outputs
• IEEE 1149.1 JTAG Interface
• IEEE 1149.6 Limited Capability
• Fault Insertion
• Single 3.3V Supply
• Very Low Power Consumption
• Industrial -40 to +85°C Temperature Range
• Small TQFP Package Footprint
• See DS90LV004 for Non-JTAG Version

DESCRIPTION
The SCAN90004 is a four channel 1.5 Gbps LVDS
buffer/repeater. High speed data paths and flow-
through pinout minimize internal device jitter and
simplify board layout, while configurable pre-
emphasis overcomes ISI jitter effects from lossy
backplanes and cables. The differential inputs
interface to LVDS, and Bus LVDS signals such as
those on TI's 10-, 16-, and 18- bit Bus LVDS SerDes,
as well as CML and LVPECL. The differential inputs
and outputs are internally terminated with a 100Ω
resistor to improve performance and minimize board
space. The repeater function is especially useful for
boosting signals for longer distance transmission over
lossy cables and backplanes.
Integrated testability circuitry supports IEEE1149.1
(JTAG) on single-ended LVTTL/CMOS I/O and
limited IEEE1149.6 capability on high-speed
differential LVDS interconnects. The 3.3V supply,
CMOS process, and LVDS I/O ensure stable high
performance at low power over the entire industrial -
40 to +85°C temperature range.




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