Members of the Texas Instruments
SCOPE E Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
Functionally Equivalent to ’F245 and
’ABT245 in the Normal-Function Mode
SCOPE E Instruction Set:
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art EPIC-IIBE BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers(FK), and Standard Ceramic
DIPs (JT)

description
The ’ABT8245 scan test devices with octal bus
transceivers are members of the Texas Instruments
SCOPEE testability integrated-circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPEE octal bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.