Members of the Texas Instruments
SCOPE Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Functionally Equivalent to ’F646 and
’ABT646 in the Normal-Function Mode
SCOPE Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
− Parallel-Signature Analysis at Inputs
With Masking Option
− Pseudorandom Pattern Generation From
Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Even-Parity Opcodes
Two Boundary-Scan Cells Per I/O for
Greater Flexibility
State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic DIPs
(JT)

description
The ’ABT8646 and scan-test devices with octal
bus transceivers and registers are members of the
Texas Instruments SCOPE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers
and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal bus transceivers and registers.