| Produttore elettronici | Il numero della parte | Scheda tecnica | Spiegazioni elettronici |
 NEC |
UPC2781GR
|
78Kb / 5P |
SI MMIC IQ DEMODULATOR
|
 California Eastern Labs |
GET-30497
|
889Kb / 24P |
Qualification Test Results on Si MMIC
|
|
GET-30569
|
4Mb / 8P |
Qualification Test Results on NE272 ser es
|
|
GET-30593
|
362Kb / 7P |
Qualification Test Report on NE681XX
|
|
GET-BC-0004
|
606Kb / 20P |
Qualification Test Report on NE292
|
|
GET-BC-0006
|
254Kb / 4P |
Qualification Test Results on Si MMIC
|
 TriQuint Semiconductor |
TQ8223
|
580Kb / 5P |
Device Qualification
|
 Tyco Electronics |
3-1461491-5
|
369Kb / 40P |
Qualification Test Report
|
 AVAGO TECHNOLOGIES LIMI... |
AEAT-7000
|
142Kb / 2P |
The following cumulative test results
|
 List of Unclassifed Man... |
AEC-Q100-REV-H
|
814Kb / 48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |