TC58FVT160/B160AFT/AXB-70,-10

2001-09-05 1/41

• Block erase architecture

1 × 16 Kbytes / 2 × 8 Kbytes

1 × 32 Kbytes / 31 × 64 Kbytes

• Boot block architecture

TC58FVT160AFT/AXB: top boot block

TC58FVB160AFT/AXB: bottom boot block

• Mode control

Compatible with JEDEC standard commands

• Erase/Program cycles

• Access time

70 ns

100 ns

• Power consumption

5 µA

(Standby)

30 mA

(Read operation)

15 mA

(Program/Erase operations)

• Package

TSOPI48-P-1220-0.50 (weight: 0.51 g)

P-TFBGA48-0608-0.80AZ (weight: TBD)

TENTATIVE

TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

16-MBIT (2M

× 8 BITS / 1M × 16 BITS) CMOS FLASH MEMORY

DESCRIPTION

The TC58FVT160/B160A is a 16,777,216-bit, 3.0-V read-only electrically erasable and programmable flash

memory organized as 2,097,152 words × 8 bits or as 1,048,576 words × 16 bits. The TC58FVT160/B160A features

commands for Read, Program and Erase operations to allow easy interfacing with microprocessors. The commands

are based on the JEDEC standard. The Program and Erase operations are automatically executed in the chip.

FEATURES

• Power supply voltage

• Operating temperature

Ta = −40°C~85°C

• Organization

2M × 8 bits / 1M × 16 bits

• Functions

Auto Program, Auto Erase

Fast Program Mode

Program Suspend/Resume

Erase Suspend/Resume

data polling / Toggle bit

block protection

Automatic Sleep, support for hidden ROM area

common flash memory interface (CFI)

Byte/Word Modes

…

…

…

…TC58FVT160/B160AFT

PIN NAMES

A-1, A0~A19

Address Input

DQ0~DQ15

Data Input/Output

CE

Chip Enable Input

OE

Output Enable Input

BYTE

Word/Byte Select Input

WE

Write Enable Input

BY

/

RY

Ready/Busy Output

RESET

Hardware Reset Input

NC

Not Connected

Power Supply

Ground

BYTE

1

48

2

47

3

46

4

45

5

44

6

43

7

42

8

41

9

40

10

39

11

38

12

37

13

36

14

35

15

34

16

33

17

32

18

31

19

30

20

29

21

28

22

27

23

26

24

25

A16

DQ15/A-1

DQ7

DQ14

DQ6

DQ13

DQ5

DQ12

DQ4

DQ11

DQ3

DQ10

DQ2

DQ9

DQ1

DQ8

DQ0

A0

OE

CE

A15

A14

A13

A12

A11

A10

A9

A8

A19

NC

NC

NC

A18

A17

A7

A6

A5

A4

A3

A2

A1

WE

RESET

BY

/

RY

• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general

can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer,

when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid

situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to

property.

In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most

recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide

for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc..

• The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal

equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are

neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or

failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control

instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control

instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document

shall be made at the customer’s own risk.

000707EBA2