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LP6212AB6F Scheda tecnica(PDF) 3 Page - Lowpower Semiconductor inc

Il numero della parte LP6212AB6F
Spiegazioni elettronici  High Efficiency 4A Boost DC/DC Convertor
PDF  7 Pages
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Produttore elettronici  POWER [Lowpower Semiconductor inc]
Homepage  http://www.lowpowersemi.com
Logo POWER - Lowpower Semiconductor inc

LP6212AB6F Scheda tecnica(HTML) 3 Page - Lowpower Semiconductor inc

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LP6212A-01
Jan.-2017
Email: marketing@lowpowersemi.com
www.lowpowersemi.com
Page 3 of 7
Preliminary Datasheet
LP6212A
Function Block Diagram
Soft start
0.6
VREF
CONTROL
LOGIC
1.2MHz
OSCILLATOR
PWM/PFM
CONTROL
PWM
COMPARAT
OR
ERROR
COMP.
COMPENSATION
SLOPE
DRIVER
M1
RS
CURRENT
AMP.
VIN
FB
LX
GND
EN
+
+
+
-
-
-
Absolute Maximum Ratings
Note 1
Supply Input Voltage ----------------------------------------------------------------------------------------------------- 6V
LX Voltage to GND ------------------------------------------------------------------------------------------------------- 12V
Other Pin Voltage to GND ----------------------------------------------------------------------------------------------- 6V
Maximum Junction Temperature ---------------------------------------------------------------------------------- 150℃
Maximum Soldering Temperature (at leads, 10 sec) -------------------------------------------------------- 260℃
Power Dissipation, PD @ TA = 25℃
SOT23-6 --------------------------------------------------------------------------------------------------------------- 450mW
Package Thermal Resistance
SOT23-6, θJA ------------------------------------------------------------------------------------------------------- 250℃/W
Recommended Operating Conditions
Operation Ambient Temperature Range ------------------------------------------------------------- −20℃ to 85℃
Note 1.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the
specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.



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