ULN2012

Preliminary

LINEAR INTEGRATED CIRCUIT

UNISONICTECHNOLOGIESCO.,LTD

5 of 6

www.unisonic.com.tw

QW-R113-020.a



TEST CIRCUIT

Components in the test circuits are used only to obtain and confirm the device characteristics. These components

and circuits are not guaranteed to prevent malfunction or failure from occurring in the application equipment.

OPEN

µA

Figure 1

OPEN

V

Figure 2

OPEN

mA

OPEN

Figure 3

OPEN

µA

µA

Figure 4

OPEN

V

V

Figure 5

OPEN

µA

Figure 6

OPEN

V

Figure 7