M28C16A datasheet(6/17 Pages) STMICROELECTRONICS

6 / 17 page

Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance

VIN =0V

COUT

Output Capacitance

VOUT =0V

Note: 1. Sampled only, not 100% tested.

Table 5. Capacitance (1) (TA =25

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

ILI

Input Leakage Current

≤ VIN ≤ VCC

µA

ILO

Output Leakage Current

≤ VIN ≤ VCC

µA

ICC

(1)

Supply Current

(CMOS inputs)

E=VIL,G = VIL, f = 5 MHz, VCC = 3.3V

E=VIL,G = VIL, f = 5 MHz, VCC = 3.6V

ICC2

(1)

Supply Current (Standby)

CMOS

E> VCC –0.3V

µA

VIL

Input Low Voltage

– 0.3

0.6

VIH

Input High Voltage

VCC +0.5

VOL

Output Low Voltage

IOL = 1 mA

0.2 VCC

VOH

Output High Voltage

IOH = 1 mA

0.8 VCC

Note: 1. All I/O’s open circuit.

Table 6. Read Mode DC Characteristics

(TA = 0 to 70

°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Symbol

Parameter

Min

Max

Unit

tPUR

Time Delay to Read Operation

µs

tPUW

Time Delay to Write Operation

VWI

Write Inhibit Threshold

1.5

2.5

Note: 1. Sampled only, not 100% tested.

Table 7. Power Up Timing (1) (TA = 0 to 70

°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

0V to VCC -0.3V

Input and Output Timing Ref.

Voltages

1.5V

Note that Output Hi-Z is defined as the point where data is no

longer driven.

Table 4. AC Measurement Conditions

AI01274

VCC –0.3V

0.5 VCC

Figure 7. AC Testing Input Output Waveforms

AI01396

VCC

OUT

CL = 100pF

CL includes JIG capacitance

1.8k

Ω

DEVICE

UNDER

TEST

1.3k

Ω

Figure 8. AC Testing Equivalent Load Circuit

6/17

M28LV16

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