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SMTAS04USB Scheda tecnica(PDF) 4 Page - List of Unclassifed Manufacturers

Il numero della parte SMTAS04USB
Spiegazioni elettronici  World most energy efficient temperature sensor
PDF  9 Pages
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Produttore elettronici  ETC1 [List of Unclassifed Manufacturers]
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SMTAS04USB Scheda tecnica(HTML) 4 Page - List of Unclassifed Manufacturers

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DATASHEET
SMT172
last update
maart 20, 2017
reference
V14
page
4
Therefore, a valid duty cycle is:
=
∑
=
Where
t
Hi
= time interval of high state
t
Li
= time interval of low state
DC
i
= duty cycle of individual period i
DC = the valid duty cycle
The specified accuracy and noise performance are based on a measurement of 8 periods. For improved
noise performance, measurement of multiples (N times) of 8 periods is recommended.
In other words:
After each period the duty cycle has to be calculated and stored. The mean duty cycle has to be taken over 8
periods or a multiple of 8 periods. This mean duty cycle is used to calculate the temperature.
Measurement always starts on the negative edge of the output signal.
Understanding the specifications
Sampling Noise
From the theory of signal processing it can be derived that there is a fixed ratio between the frequency of the
sensor output, the sampling rate and the sampling noise. The uncertainty of the temperature measurement is
determined by:
= 200
6
t
p
t
s
Note:
The above mentioned error Terr is NOT related to the intrinsic accuracy of the sensor. It just indicates how
the uncertainty (standard deviation) is influenced when a microcontroller samples a time signal.
Sensor noise
Each semiconductor product generates noise, also the SMT172 sensor. The lower limit of the noise is
determined by the flicker noise of the sensor, where further averaging will no longer reduce it. So the
measured noise of the sensor of course depends on the measurement time. The noise of the sensor is
about 0.002°C when measuring over 3.6ms (8 periods, 5V). When measuring over about 0.1s the sensor
noise is reduced to 0.0004°C.
Where T
err = measurement uncertainty of temperature (= standard deviation of the sampling
noise)
t
s = microcontrollers sampling rate
t
p = period of the sensor output
t
m = total measurement time, an integer number of
t
p



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