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TUSB216I Scheda tecnica(PDF) 3 Page - Texas Instruments

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Il numero della parte TUSB216I
Spiegazioni elettronici  TUSB216I USB 2.0 High-Speed Signal Conditioner With BC 1.2 Controller
PDF  32 Pages
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Produttore elettronici  TI [Texas Instruments]
Homepage  http://www.ti.com
Logo TI - Texas Instruments

TUSB216I Scheda tecnica(HTML) 3 Page - Texas Instruments

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5 Pin Configuration and Functions
4
SDA
3
5
6
9
10
11
12
1
8
7
SCL/CD
RSTN
BOOST
D2P
D2M
RX_SEN/ENA_HS
GND
CDP_ENZ
VCC
D1M
D1P
2
Not to scale
Figure 5-1. TUSB216I RWB 12-Pin X2QFN Top View
Table 5-1. Pin Functions
PIN
I/O
INTERNAL
PULLUP/PULLDOWN
DESCRIPTION
NAME
NO.
BOOST
6
I
N/A
USB High-speed boost select via external pull down resistor.
Both edge boost and DC boost are controlled by a single pin in non-
I2C mode. In I2C mode edge boost and DC boost can be individually
controlled.
Sampled upon power up. Does not recognize real time adjustments.
Auto selects BOOST LEVEL = 3 when left floating.
CDP_ENZ
11
I
500 kΩ PU
Set CDP_ENZ is low to enable BC 1.2 CDP controller
RX_SEN2/ENA_HS
9
I/O
N/A
In I2C mode:
Reserved for TI test purpose.
In non-I2C mode:
At reset: 3-level input signal RX_SEN. USB High-speed RX
Sensitivity Setting to Compensate ISI Jitter
H (pin is pulled high) – high RX sensitivity (high loss channel)
M (pin is left floating) – medium RX sensitivity (medium loss channel)
L (pin is pulled low) – low RX sensitivity (low loss channel)
After reset: Output signal ENA_HS. Flag indicating that channel is in
High-speed mode. Asserted upon:
1. Detection of USB-IF High-speed test fixture from an unconnected
state followed by transmission of USB TEST_PACKET pattern.
2. Squelch detection following USB reset with a successful HS
handshake [HS handshake is declared to be successful after single
chirp J chirp K pair where each chirp is within 18 μs – 128 μs].
D2P
7
I/O
N/A
USB High-speed positive port.
www.ti.com
TUSB216I
SLLSFM9 – MARCH 2021
Copyright © 2021 Texas Instruments Incorporated
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