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183CPHT Scheda tecnica(PDF) 5 Page - Vishay Siliconix |
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183CPHT Scheda tecnica(HTML) 5 Page - Vishay Siliconix |
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5 / 6 page ![]() 183 CPHT www.vishay.com Vishay BCcomponents Revision: 04-Feb-2021 5 Document Number: 28434 For technical questions, contact: aluminumcaps1@vishay.com THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 USEFUL LIFE AND ENDURANCE Table 7 Note (1) Identical with endurance for this series Endurance can be calculated by formula below: L: estimated lifetime (h) LTmax.: base lifetime specified at maximum operating temperature with applied DC voltage (h) Tmax.: rated maximum operating temperature (°C) Ta: actual ambient temperature (°C) Table 8 Table 9 Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability. ENDURANCE TEST AND USEFUL LIFE SERIES CASE CODE USEFUL LIFE AT 125 °C (h) (1) ENDURANCE AT 125 °C (h) ENDURANCE AT 105 °C (h) ENDURANCE AT 85 °C (h) ENDURANCE AT 75 °C (h) ENDURANCE AT 65 °C (h) 183 CPHT 0506 to 1010 4000 4000 16 000 64 000 128 000 256 000 MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY FREQUENCY (Hz) 120 1000 10 000 ≥ 100 000 IR MULTIPLIER 0.1 0.3 0.6 1 TEST PROCEDURES AND REQUIREMENTS TEST PROCEDURE (quick reference) REQUIREMENTS NAME OF TEST REFERENCE Mounting IEC 60384-25, subclause 4.3 Shall be performed prior to tests mentioned below; reflow soldering; for maximum temperature load refer to chapter “Mounting” ΔC/C: ± 5 % tan δ ≤ spec. limit IL2 ≤ spec. limit Endurance IEC 60384-25 / CECC 32300, subclause 4.15 Tamb = 125 °C; UR applied; for test duration see Table 7 ΔC/C: ± 30 % tan δ ≤ 2 x spec. limit IL2 ≤ spec. limit ESR ≤ 2 x spec. limit Useful life CECC 30301, subclause 1.8.1 Tamb = 125 °C; UR and IR applied; for test duration see Table 7 ΔC/C: ± 30 % tan δ ≤ 2 x spec. limit IL2 ≤ spec. limit ESR ≤ 2 x spec. limit Shelf life (storage at high temperature) IEC 60384-25 / CECC 32300, subclause 4.16 Tamb = 125 °C; no voltage applied; 1000 h after test: UR to be applied for 30 min, 24 h to 48 h before measurement For requirements see “Endurance test” above LL Tmax. x 2 T max. - Ta 10 ------------------------- = |
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