FXLS8967AFR3 datasheet(7/98 Pages) NXP

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NXP Semiconductors

FXLS8967AF

3-Axis Low-g Accelerometer

Symbol

Rating

Min

Unit

VHBM

Human Body Model

±2000

VCDM

Charged Device Model

±500

ILU

Latch-up current at T = +105 °C (per AEC-Q100-004)

±100

Table 5. ESD and latch-up-protection characteristics

CAUTION

This device is sensitive to mechanical shock. Improper handling can cause permanent damage to the

part or cause the part to otherwise fail.

CAUTION

This device is sensitive to ElectroStatic Discharge (ESD). Observe precautions for handling

electrostatic sensitive devices.

Such precautions are described in the ANSI/ESD S20.20, IEC/ST 61340-5, JESD625-A or equivalent

standards.

8 Recommended operating conditions

Symbol

Parameter

Min

Typ

Max

Unit

VDD

Supply voltage

1.71

3.0

3.6

Top

Operating temperature range

–40

+25

+105

°C

Table 6. Nominal operating conditions

9 Mechanical characteristics

VDD = 1.8 V to 3.0 V, T = –40 °C to 105 °C, unless otherwise noted.

Typical values represent mean or mean ±1 σ values, depending on the specific parameter.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

nACC

Output data width

—

bits

±2 g mode

—

±2

—

±4 g mode

—

±4

—

±8 g mode

—

±8

—

FSR

Full-scale measurement range

±16 g mode

—

±16

—

Table 7. Accelerometer sensor performance parameters

FXLS8967AF

All information provided in this document is subject to legal disclaimers.

Objective data sheet

Rev. 1 — 27 April 2021

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