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ADM8641T263ACBZ-R7 Scheda tecnica(PDF) 9 Page - Analog Devices

Il numero della parte ADM8641T263ACBZ-R7
Spiegazioni elettronici  Ultralow Power Voltage Detector
PDF  11 Pages
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Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
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ADM8641T263ACBZ-R7 Scheda tecnica(HTML) 9 Page - Analog Devices

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Data Sheet
ADM8641/ADM8642
Rev. D | Page 9 of 11
THEORY OF OPERATION
The ADM8641 and ADM8642 ultralow power voltage detectors
are especially suited for battery-powered applications due to the
190 nA quiescent current (maximum). The internal precision
reference allows the user to monitor specific voltage levels accur-
ately from 0.5 V to 4.63 V. These devices feature internal input
hysteresis and an open-drain output. The output remains logic
high after the monitored input is above the preset threshold. The
output changes to logic low after the input voltage falls below
the threshold. The devices keep the output in a logic low state
whenever the supply voltage on the VCC pin is below the
UVLO threshold. The output disable input can also keep the
output low regardless of the status on the input.
ADM8641
MICRO-
PROCESSOR
VCC
OUT
INPUT
GND
DIS
3.3V
VIO
Figure 17. ADM8641 Typical Application Circuit
ADM8642
MICRO-
PROCESSOR
VCC
VIN
OUT
GND
12V
3.3V
INPUT
VIO
DIS
Figure 18. ADM8642 Typical Application Circuit
VOLTAGE MONITORING INPUT
The VCC pin on the ADM8641 acts as both a device power
input node and a voltage monitoring input node. The ADM8642
uses separate pins for supply and voltage monitoring to achieve
a low voltage monitoring threshold to 0.5 V. It is recommended
to place a 0.1 μF decoupling capacitor between the VCC pin
and the GND pin.
VCC Slew Rate Consideration
A fast VCC ramp (μs range) on power-up can cause the device
to behave in an irregular manner. In applications where a high
slew rate on VCC is possible, for example, powering up using a
battery pack, it is recommended that an RC filter is used to
reduce the slew rate. RC combinations of 3.3 kΩ + 2.2 μF and
1 kΩ + 10 μF have been tested and identified as safe options.
VIN AS AN ADJUSTABLE INPUT
Due to the low leakage nature of the VIN pin, the ADM8642 can
be used as a device with an adjustable threshold. Use an
external resistor divider circuit to program the desired voltage
monitoring threshold based on the VIN threshold, as shown in
Figure 19.
ADM8642
MICRO-
PROCESSOR
VCC
VIN
OUT
GND
0.8V
3.3V
INPUT
VIO
DIS
Figure 19. ADM8642 as an Adjustable Threshold Device
TRANSIENT IMMUNITY
To avoid unnecessary output state changes caused by fast
power supply transients, an input glitch filter is added to the
VCC pin of the ADM8641 and the VIN pin of the ADM8642 to
filter out the transient glitches on these pins.
Figure 11 shows the comparator overdrive (that is, the maximum
magnitude of positive and negative going pulses with respect to
the typical threshold) vs. the pulse duration without changing
the state of the output.
OUTPUT
Both the ADM8641 and ADM8642 voltage detectors have an
open-drain output. For the ADM8641, the state of the output is
guaranteed to be valid as soon as VCC rises above 0.9 V. For the
ADM8642, the output is guaranteed to be logic low from when
VCC = 0.9 V to when the device exits ULVO.
When the monitored voltage falls below its associated threshold,
the OUT pin asserts low after 23 μs to 26 μs (typical). When the
monitored voltage rises above the threshold plus hysteresis, the
OUT pin asserts high after 36 μs to 39.5 μs (typical).
DISABLE INPUT
The ADM8641/ADM8642 feature a disable input (DIS). Drive the
DIS pin low to assert the output low. The DIS input has a 0.6 MΩ
internal pull-up resistor so that the input is always high when
unconnected. To drive the DIS input, use an external signal or
a push-button switch to ground; debounce circuitry is integrated
on-chip for this purpose. Noise immunity is provided on the
DIS input, and fast, negative going transients of up to 0.4 μs
(typical) are ignored. If required, a 0.1 μF capacitor between
the DIS pin and ground provides additional noise immunity.
VCC
OUT
VTH
VTH + VHYST
tPD_VCC
DIS EXTERNALLY
DRIVEN LOW
DIS
tPD_VCC
tD_DIS
tD_DIS
Figure 20. DIS Input Timing



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