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DS90C387RVJD Scheda tecnica(PDF) 7 Page - National Semiconductor (TI) |
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DS90C387RVJD Scheda tecnica(HTML) 7 Page - National Semiconductor (TI) |
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7 / 28 page ![]() AC Timing Diagrams (Continued) Note 10: The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and CMOS/TTL I/O. Note 11: The 16 grayscale test pattern tests device power consumption for a “typical” LCD display pattern. The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display. 10128811 FIGURE 2. “16 Grayscale” Test Pattern (Note 11) www.national.com 7 |
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