HY5V52F datasheet(7/13 Pages) HYNIX

7 / 13 page

Rev. 0.1 / June. 2004

Preliminary

HY5V52(L)F(P) Series

4Banks x 2M x 32bits Synchronous DRAM

ABSOLUTE MAXIMUM RATING

DC OPERATING CONDITION (TA= 0 to 70oC )

Note :

1. All voltages are referenced to VSS = 0V

2. VIH(max) is acceptable 5.6V AC pulse width with <=3ns of duration.

3. VIL(min) is acceptable -2.0V AC pulse width with <=3ns of duration

AC OPERATING TEST CONDITION (TA= 0 to 70 oC, VDD=3.3±0.3V, VSS=0V)

Parameter

Symbol

Rating

Unit

Ambient Temperature

0 ~ 70

Storage Temperature

TSTG

-55 ~ 125

Voltage on Any Pin relative to VSS

VIN, VOUT

-1.0 ~ 4.6

Voltage on VDD relative to VSS

VDD

-1.0 ~ 4.6

Voltage on VDDQ relative to VSS

VDDQ

-1.0 ~ 4.6

Short Circuit Output Current

IOS

Power Dissipation

Soldering Temperature . Time

TSOLDER

260 . 10

oC . Sec

Parameter

Symbol

Min

Typ

Max

Unit

Note

Power Supply Voltage

VDD, VDDQ

3.0

3.3

3.6

Input High Voltage

VIH

2.0

3.3

VDDQ+0.3

1, 2

Input Low Voltage

VIL

-0.3

0.8

1, 3

Parameter

Symbol

Value

Unit

Note

AC Input High/Low Level Voltage

VIH / VIL

2.4/0.4

Input Timing Measurement Reference Level Voltage

Vtrip

1.4

Input Rise/Fall Time

tR / tF

1ns

Output Timing Measurement Reference Level Voltage

Voutref

1.4

Output Load Capacitance for Access Time Measurement

HY5V52F Scheda tecnica(PDF) 7 Page - Hynix Semiconductor

HY5V52F Scheda tecnica(HTML) 7 Page - Hynix Semiconductor

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13

Scheda tecnica Scarica

Link URL