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TC7SH34F Scheda tecnica(PDF) 2 Page - Toshiba Semiconductor

Il numero della parte TC7SH34F
Spiegazioni elettronici  CMOS Digital Integrated Circuits Silicon Monolithic
PDF  7 Pages
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Produttore elettronici  TOSHIBA [Toshiba Semiconductor]
Homepage  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TC7SH34F Scheda tecnica(HTML) 2 Page - Toshiba Semiconductor

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TC7SH34F
2
4.
4.
4.
4. Marking and Pin Assignment
Marking and Pin Assignment
Marking and Pin Assignment
Marking and Pin Assignment
Marking
Marking
Marking
Marking
Pin Assignment (Top view)
Pin Assignment (Top view)
Pin Assignment (Top view)
Pin Assignment (Top view)
5.
5.
5.
5. IEC Logic Symbol
IEC Logic Symbol
IEC Logic Symbol
IEC Logic Symbol
6.
6.
6.
6. Truth Table
Truth Table
Truth Table
Truth Table
A
L
H
Y
L
H
7.
7.
7.
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Supply voltage
Input voltage
DC output voltage
Input diode current
Output diode current
DC output current
VCC/ground current
Power dissipation
Storage temperature
Symbol
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Tstg
Note
(Note 1)
Rating
-0.5 to 7.0
-0.5 to 7.0
-0.5 to VCC + 0.5
-20
±20
±25
±50
200
-65 to 150
Unit
V
mA
mW
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: VOUT < GND, VOUT > VCC
2017-12-21
Rev.3.0
©2015-2017
Toshiba Electronic Devices & Storage Corporation



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