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74F166 Scheda tecnica(PDF) 6 Page - NXP Semiconductors

Il numero della parte 74F166
Spiegazioni elettronici  8-bit bidirectional universal shift register
PDF  12 Pages
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Produttore elettronici  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F166 Scheda tecnica(HTML) 6 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F166
8-bit bidirectional universal shift register
Feb. 14, 1991
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN
TYP2
MAX
VOH
High–level output voltage
VCC = MIN, VIL =
MAX,
IOH = MAX
±10%V
CC
2.5
V
VIH = MIN
±5%V
CC
2.7
3.4
V
VOL
Low–level output voltage
VCC = MIN, VIL =
MAX,
IOL = MAX
±10%V
CC
0.30
0.50
V
VIH = MIN
±5%V
CC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
-0.73
-1.2
V
II
Input current at maximum
others
VCC = 0.0V, VI = 7.0V
100
µA
input voltage
CE, CP3
others
20
µA
IIH
High–level input
MR, Ds
VCC = MAX, VI = 2.7V
40
µA
current
Industrial
others
40
µA
only
MR, Ds
80
µA
IIL
Low–level input current
others
VCC = MAX, VI = 0.5V
-20
µA
MR, Ds
-40
µA
IOS
Short–circuit output current4
VCC = MAX
-60
-150
mA
ICC
Supply current (total)
VCC = MAX, PE = CE = Dn = GND,
MR = Ds = 4.5V, CP =
↑
50
70
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. When testing CP, CE must remain in high state, whereas CP must remain in high state when testing CE.
4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
Tamb = +25°C
Tamb = 0°C to
+70
°C
Tamb = –40°C to +85°C
SYMBOL
PARAMETER
TEST
VCC = +5.0V
VCC = +5.0V ± 10%
VCC = +5.0V ± 10%
UNIT
CONDITION
CL = 50pF,
RL = 500Ω
CL = 50pF,
RL = 500Ω
CL = 50pF,
RL = 500Ω
MIN
TYP
MAX
MIN
MAX
MIN
MAX
fmax
Maximum clock frequency
Waveform 1
135
175
110
100
ns
tPLH
tPHL
Propagation delay
CP to Q7
Waveform 1
5.0
4.0
7.5
6.0
10.0
8.0
5.0
3.5
12.0
9.0
5.0
3.5
13.0
9.0
ns
tPHL
Propagation delay
MR to Q7
Waveform 2
4.0
6.5
8.5
4.0
9.5
4.0
9.5
ns



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