PI5USB2546J

www.diodes.com

November 2020

Document Number DS43167 Rev 1-2

5

© Diodes Incorporated

PI5USB2546J

Electrical Characteristics

4.5V≤VIN≤5.5V; TJ=-40°C to +125°C; VEN =VIN, VILIM_SEL=VIN, VCTL1= VCTL2= VCTL3=VIN, R/FAULT=R/STATUS=10kΩ RILIM_HI=20kΩ,

RILIM_LO=80.6kΩ, Positive currents are into pins. Typical values are at 25°C. All voltages are with respect to GND. unless otherwise specified.

Symbol

Description

Test Conditions

Min.

Typ.

Max.

Unit

ILIM_SEL Current Limit

IOS

OUT Current-limit(2)

VILIM_SEL= 0 V RILIM_LO=210kΩ

205

240

275

mA

VILIM_SEL= 0 V RILIM_LO=80.6kΩ

575

625

680

VILIM_SEL= 0 V RILIM_LO=22.1kΩ

2120

2275

2430

VILIM_SEL= VIN RILIM_HI=20kΩ

2340

2510

2685

VILIM_SEL= VIN RILIM_HI=16.9kΩ

2770

2970

3170

tIOS

Response time to OUT short circuit(1)

VIN = 5.0V, R=0.1Ω, lead length=2”

-

1.5

-

s

Supply Current

IIN_OFF

Disabled IN supply current

VEN=0V, VOUT=0V, TJ =-40°C to +125°C

-

0.1

2

A

IIN_ON

Enable IN supply current

VCTL1=VCTL2= VIN; VCTL3= 0V VILIM_SEL = 0V

-

165

220

VCTL1 = VCTL2 = VCTL3 = VIN, VILIM_SEL = 0V

-

175

230

VCTL1 = VCTL2 = VIN; VCTL3 = 0V, VILIM_SEL = VIN

-

185

240

VCTL1 = VCTL2 = VCTL3 = VIN,VILIM_SEL = VIN

-

195

250

VCTL1 = 0V; VCTL2 = VCTL3 = VIN, VILIM_SEL = 0V

-

215

270

VCTL1 = 0V; VCTL2 = VCTL3 = VIN, VILIM_SEL = VIN

-

240

295

Undervoltage Lockout

VUVLO

IN rising UVLO threshold voltage

-

3.9

4.1

4.3

V

Hysteresis(1)

-

-

100

-

mV

/FAULT

VOL

Output low voltage

I/FAULT = 1mA

-

-

100

mV

IOFF

Off-state leakage current

V/FAULT = 5.5V

-

-

1

A

TD

Over current /FAULT rising and falling deglitch

-

5

8.2

12

ms

/STATUS

VOL

Output low voltage

I/STATUS = 1mA

-

-

100

mV

IOFF

Off-state leakage

V/STATUS = 5.5V

-

-

1

A

Thermal Shutdown

OTSD

Thermal shutdown threshold

-

170

-

°C

Hysteresis(1)

-

-

20

-

Note:

(1) These parameters are provided for reference only and do not constitute part of Diodes’ published device specifications for purposes of Diodes’ product

warranty

(2) Pulse-testing techniques maintain junction temperature close to ambient temperature; current limit value tested at 80% output voltage. Thermal effects must

be taken into account separately.