STM32G0C1NET6XTR datasheet(94/159 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32G0C1xC/xE

94/159

DS13564 Rev 4

5.3.13

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDDIOx (for standard, 3.3 V-capable I/O pins) should be avoided during normal

product operation. However, in order to give an indication of the robustness of the

microcontroller in cases when abnormal injection accidentally happens, susceptibility tests

are performed on a sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out-of-range parameter: ADC error above a certain limit

(higher than 5 LSB TUE), induced leakage current on adjacent pins out of conventional

limits (-5 µA/+0 µA range) or other functional failure (for example reset occurrence or

oscillator frequency deviation).

Negative induced leakage current is caused by negative injection and positive induced

leakage current is caused by positive injection.

Table 54. I/O current injection susceptibility(1)

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on

All except PA4, PA5, PA6, PB0,

PB3, and PC0

-5

N/A

PA4, PA5

-5

PA6, PB0, PB3, and PC0

N/A

1. Based on characterization results, not tested in production.

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