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NCP4425P Scheda tecnica(PDF) 8 Page - ON Semiconductor |
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NCP4425P Scheda tecnica(HTML) 8 Page - ON Semiconductor |
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8 / 12 page ![]() NCP4423, NCP4424, NCP4425 http://onsemi.com 8 TYPICAL ELECTRICAL CHARACTERISTICS VIN Figure 21. NCP4423 Crossover Energy AMBIENT TEMPERATURE ( °C) Figure 22. Thermal Derating Curves 16 Pin SOIC 1400 1200 1000 800 600 400 200 0 0 20 40 60 80 100 120 140 0 2 4 6 8 10 1214 1618 –8 8 6 4 2 –9 8 6 4 2 –10 10 10 10 NOTE: The values on this graph represent the loss seen by both drivers in a package during one complete cycle. For a single driver, divide the stated values by 2. For a single transition of a single driver, divide the stated value by 4. Static–sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those listed under Absolute Maximum Ratings (See page 2) may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating Conditions for extended periods may affect device reliability. |
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