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STV-6410-R01 Scheda tecnica(PDF) 96 Page - STMicroelectronics

Il numero della parte STV-6410-R01
Spiegazioni elettronici  Mono and Colour Digital Video CMOS Image Sensors
PDF  105 Pages
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Produttore elettronici  STMICROELECTRONICS [STMicroelectronics]
Homepage  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STV-6410-R01 Scheda tecnica(HTML) 96 Page - STMicroelectronics

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VV5410 & VV6410
Pixel Defect Specification
cd5410-6410f-3-0.fm
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Figure 51 : Single Column Faults
13.5 Image Array Blemishes
The automatic test programme rejects any sensors that contain blemishes referred to as blobs and clusters (please see below for
definitions of these terms) as they cannot be successfully defect corrected by ST coprocessor devices. Up to 120 single pixel
faults can be corrected and sensors meeting this criteria will PASS this part of the test programme.
13.5.1 Cluster Definition
A failing pixel at X with a failing pixel at position [0] or [1] or [2] or [3] or [4] or [5] or [6] or [7] or any combination of these 8
positions except the case where all positions are defective. This is a special case and is described below. In the example in
Figure 52 there are additional pixel fails in positions [3] and [7].
Figure 52 : Cluster Example
Blob (special case of cluster):- a failing pixel at position X with failing pixels at position [0],[1],[2],[3],[4],[5],[6] and [7] as in Figure
53 below:
Figure 53 : Blob Example
n
n+1
X
‘p’
X
‘p’
X
p
X
‘p’
‘p’
X
‘p’
X
‘p’
X
‘p’
X
[0]
[1]
[2]
[X]
X
[X]
[6]
[5]
[4]
[X][X][X]
[X]
X
[X]
[X][X][X]



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