AM26C32MFKB datasheet(7/36 Pages) TI1

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TEST CIRCUIT

Device

Under

Test

G Input

VCC

RL = 1 kΩ

CL = 50 pF

(see Note A)

VID = ±2.5 V

VOLTAGE WAVEFORMS

tPZL, tPLZ Measurement: S1 to VCC

tPZH, tPHZ Measurement: S1 to GND

1.3 V

(see Note B)

Output

(with VID = 2.5 V)

Output

(with VID = −2.5 V)

tPZH

tPHZ

tPZH

tPHZ

tPZL

tPLZ

tPZL

tPLZ

VOH −0.5 V

VOL + 0.5 V

VOH −0.5 V

VOL + 0.5 V

3 V

0 V

3 V

0 V

VOH

VOL

VOH

VOL

1.3 V

50%

A Input

B Input

TEST CIRCUIT

VOLTAGE WAVEFORMS

0 V

Output

VOH

VOL

10%

90%

10%

tTLH

tTHL

tPLH

tPHL

2.5 V

−2.5 V

50%

Input

Device

Under

Test

VCC

CL = 50 pF

(see Note A)

Input

AM26C32

www.ti.com

SLLS104L – DECEMBER 1990 – REVISED OCTOBER 2018

Product Folder Links: AM26C32

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7 Parameter Measurement Information

CL includes probe and jig capacitance.

Figure 2. Switching Test Circuit and Voltage Waveforms

CL includes probe and jig capacitance.

The input pulse is supplied by a generator having the following characteristics: PRR = 1 MHz, duty cycle

≤ 50%, tr = tf

= 6 ns.

Figure 3. Enable/Disable Time Test Circuit and Output Voltage Waveforms

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