MCP3002

DS21294E-page 6

 2000-2011 Microchip Technology Inc.

2.0

TYPICAL PERFORMANCE CHARACTERISTICS

Note: Unless otherwise indicated, VDD = 5V, fSAMPLE = 200 ksps, fCLK = 16* fSAMPLE, TA = +25°C.

FIGURE 2-1:

Integral Nonlinearity (INL)

vs. Sample Rate.

FIGURE 2-2:

Integral Nonlinearity (INL)

vs. Code.

FIGURE 2-3:

Integral Nonlinearity (INL)

vs. Temperature.

FIGURE 2-4:

Integral Nonlinearity (INL)

vs. Sample Rate (VDD = 2.7V).

FIGURE 2-5:

Integral Nonlinearity (INL)

vs. Code (VDD = 2.7V).

FIGURE 2-6:

Integral Nonlinearity (INL)

vs. Temperature (VDD = 2.7V).

Note:

The graphs provided following this note are a statistical summary based on a limited number of samples

and are provided for informational purposes only. The performance characteristics listed herein are not

tested or guaranteed. In some graphs, the data presented may be outside the specified operating range

(e.g., outside specified power supply range) and therefore outside the warranted range.

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0

25

50

75 100 125 150 175 200 225 250

Sample Rate (ksps)

Positive INL

Negative INL

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0

128

256

384

512

640

768

896 1024

Digital Code

VDD = 5V

fSAMPLE = 200 ksps

-0.5

-0.4

-0.3

-0.2

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

-50

-25

0

25

50

75

100

Temperature (°C)

Positive INL

Negative INL

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

025

50

75

100

Sample Rate (ksps)

Positive INL

Negative INL

VDD = 2.7V

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0

128

256

384

512

640

768

896 1024

Digital Code

VDD = 2.7V

fSAMPLE = 75 ksps

-0.5

-0.4

-0.3

-0.2

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

-50

-25

0

25

50

75

100

Temperature (°C)

Positive INL

VDD = 2.7V

fSAMPLE = 75 ksps

Negative INL