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DAC39RFS12ACK Scheda tecnica(PDF) 8 Page - Texas Instruments |
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DAC39RFS12ACK Scheda tecnica(HTML) 8 Page - Texas Instruments |
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8 / 208 page ![]() 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted)(1) PARAMETER TEST CONDITIONS MIN MAX UNIT Supply voltage range Supply voltage range, VDDA18A, VDDA18B(2) -0.3 2.45 V Supply voltage range, VEEAM18, VEEBM18(2) -2.0 0.3 V Supply voltage range, VDDCLK18, VDDSYS18(3) -0.3 2.45 V Supply voltage range, VDDLB, VDDLA, VDDCLK10(3) -0.3 1.3 V Supply voltage range, VDDIO, VQPS, VDDR18(4) -0.3 2.45 V Supply voltage range, VDDDIG, VDDEB, VDDEA, VDDT(4) -0.3 1.3 V Voltage between any combination of AGND, DGND and VSSCLK Voltage between any combination of AGND, DGND and VSSCLK -0.1 0.1 V Voltage applied to input pins CLK+, CLK–, SYSREF+, SYSREF-(3) -0.3 VDDCLK18+0.3 V [0:15]SRX-/+ AC Voltage 1.6 [0:15]SRX-/+ DC Voltage to GND -5 5 SCLK, SCS, SDI, RESET, SYNC, SCANEN, TXEN[0:1], FRDI[0:3], FRCLK, FRCS, SYNC (4) -0.3 VDDIO+0.3 EXTREF(2) -0.3 VDDA18A + 0.3 Voltage at output pins DACOUTA+, DACOUTA-(2) -0.3 VDDA18A + 0.5 V DACOUTB+, DACOUTB-(2) -0.3 VDDA18B + 0.5 ATEST, RBIAS-/+(2) -0.5 VDDA18B + 0.3 SDI, SDO, ALARM(4) -0.5 VDDIO + 0.3 Peak input current (any input) -20 20 mA Peak total input current (sum of absolute value of all currents forced in or out, not including power supply current and DACOUTA+, DACOUTA–, DACOUTB+ and DACOUTB–) 30 mA Junction temperature, TJ 150 °C Storage temperature, Tstg -65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Measured to AGND. (3) Measured to VSSCLK. (4) Measured to DGND. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ ESDA/JEDEC JS-001, all pins(1) 1000 V Charged device model (CDM), per ANSI/ ESDA/JEDEC JS-002, all pins(2) 250 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. DAC39RF12, DAC39RFS12 SBASAS1 – NOVEMBER 2023 www.ti.com 8 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated Product Folder Links: DAC39RF12 DAC39RFS12 |
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