16

Am29BL802C Known Good Die

SU PP L E ME NT

REVISION SUMMARY

Revision A (December 19, 2000)

Initial release.

Revision A+1 (June 27, 2001)

Manufacturing Information

Added Penang, Malaysia as a test facility (ACN2016).

Revision A+2 (September 13, 2002)

Changed title from Boot Sector to Burst Sector.

AC Characteristics

Added Read Options, Burst Mode Read, Erase/

Program Operations, and Alternate CE# Controlled

Erase/Program Operations Tables.

Trademarks

Copyright © 2001 Advanced Micro Devices, Inc. All rights reserved.

AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.

Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.