PLUS17310 datasheet(4/8 Pages) PHILIPS

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Philips Semiconductors Programmable Logic Devices

Product specification

PLUS173–10

Programmable logic array

(22

× 42 × 10)

October 22, 1993

DC ELECTRICAL CHARACTERISTICS

°C ≤ Tamb ≤ +75°C, 4.75 ≤ VCC ≤ 5.25V

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

MIN

TYP1

MAX

UNIT

Input voltage2

VIL

Low

VCC = MIN

0.8

VIH

High

VCC = MAX

2.0

VIC

Clamp

VCC = MIN, IIN = –12mA

–0.8

–1.2

Output voltage2

VCC = MIN

VOL

Low4

IOL = 15mA

0.4

0.5

VOH

High5

IOH = –2mA

2.4

2.9

Input current9

VCC = MAX

IIL

Low

VIN = 0.45V

–20

–100

µA

IIH

High

VIN = VCC

µA

Output current

VCC = MAX

IO(OFF)

Hi-Z state8

VOUT = 2.7V

µA

VOUT = 0.45V

–15

–140

IOS

Short circuit3, 5, 6

VOUT = 0V

–15

–30

–70

ICC

VCC supply current7

VCC = MAX

170

210

Capacitance

VCC = 5V

IIN

Input

VIN = 2.0V

I/O

VB = 2.0V

NOTES:

1. All typical values are at VCC = 5V, Tamb = +25°C.

2. All voltage values are with respect to network ground terminal.

3. Test one at a time.

4. Measured with inputs I0 – I4 = 0V, inputs I5 – I9 = 4.5V, I11 = 4.5V and I10 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the

same conditions except I11 = 0V.

5. Same conditions as Note 4 except input I11 = +10V.

6. Duration of short circuit should not exceed 1 second.

7. ICC is measured with inputs I0 – I11 and B0 – B9 = 0V. Part in Virgin State.

8. Leakage values are a combination of input and output leakage.

9. IIL and IIH limits are for dedicated inputs only (I0 – I11).

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