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MSC7119 Scheda tecnica(PDF) 20 Page - Freescale Semiconductor, Inc |
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MSC7119 Scheda tecnica(HTML) 20 Page - Freescale Semiconductor, Inc |
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20 / 56 page ![]() MSC7119 10/100 Mbps Ethernet MAC Data Sheet, Rev. 6 Electrical Characteristics Freescale Semiconductor 20 Table 6 lists the DDR DRAM capacitance. Tri-state (high impedance off state) leakage current, VIN = VDDIO IOZ –1.0 0.09 1 µA Signal low input current, VIL = 0.4 V IL –1.0 0.09 1 µA Signal high input current, VIH = 2.0 V IH –1.0 0.09 1 µA Output high voltage, IOH = –2 mA, except open drain pins VOH 2.0 3.0 — V Output low voltage, IOL= 5 mA VOL —0 0.4 V Typical power at 300 MHz5 P — 324.0 — mW Notes: 1. The value of VDDM at the MSC7119 device must remain within 50 mV of VDDM at the DRAM device at all times. 2. VREF must be equal to 50% of VDDM and track VDDM variations as measured at the receiver. Peak-to-peak noise must not exceed ±2% of the DC value. 3. VTT is not applied directly to the MSC7119 device. It is the level measured at the far end signal termination. It should be equal to VREF. This rail should track variations in the DC level of VREF. 4. Output leakage for the memory interface is measured with all outputs disabled, 0 V ≤ VOUT ≤ VDDM. 5. The core power values were measured.using a standard EFR pattern at typical conditions (25°C, 300 MHz, 1.2 V core). Table 6. DDR DRAM Capacitance Parameter/Condition Symbol Max Unit Input/output capacitance: DQ, DQS CIO 30 pF Delta input/output capacitance: DQ, DQS CDIO 30 pF Note: These values were measured under the following conditions: • VDDM = 2.5 V ± 0.125 V • f = 1 MHz • TA = 25°C • VOUT = VDDM/2 • VOUT (peak to peak) = 0.2 V Table 5. DC Electrical Characteristics (continued) Characteristic Symbol Min Typical Max Unit |
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