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OPA130UA/2K5 Scheda tecnica(PDF) 2 Page - Texas Instruments

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Il numero della parte OPA130UA/2K5
Spiegazioni elettronici  Low Power, Precision FET-INPUT OPERATIONAL AMPLIFIERS
PDF  16 Pages
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Produttore elettronici  TI [Texas Instruments]
Homepage  http://www.ti.com
Logo TI - Texas Instruments

OPA130UA/2K5 Scheda tecnica(HTML) 2 Page - Texas Instruments

  OPA130UA/2K5 Datasheet HTML 1Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 2Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 3Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 4Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 5Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 6Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 7Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 8Page - Texas Instruments OPA130UA/2K5 Datasheet HTML 9Page - Texas Instruments Next Button
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OPA130, OPA2130, OPA4130
2
SBOS053A
www.ti.com
ABSOLUTE MAXIMUM RATINGS(1)
Supply Voltage, V+ to V– .................................................................... 36V
Input Voltage ..................................................... (V–) –0.7V to (V+) +0.7V
Output Short-Circuit(2) .............................................................. Continuous
Operating Temperature .................................................. –40
°C to +125°C
Storage Temperature ..................................................... –40
°C to +125°C
Junction Temperature ...................................................................... 150
°C
NOTE: (1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods may degrade
device reliability. (2) Short-circuit to ground, one amplifier per package.
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
For the most current package and ordering information, see
the Package Option Addendum at the end of this document,
or see the TI web site at www.ti.com.
PACKAGE/ORDERING INFORMATION



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