TLE2662 datasheet(10/40 Pages) TI

10 / 40 page

TLE2662

DUAL

µPOWER JFET-INPUT OPERATIONAL AMPLIFIER

WITH SWITCHED-CAPACITOR VOLTAGE CONVERTER

SLOS118B – DECEMBER 1992 – REVISED AUGUST 1994

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

–

VCC +

VCC –

10 k

Ω

100

Ω

(see Note A)

NOTE A: CL includes fixture capacitance.

Figure 3. Unity-Gain Bandwidth and Phase-Margin Test Circuit

amplifier input bias offset current

At the picoampere bias-current level typical of the TLE2662, accurate measurement of the amplifier’s bias

current becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages can

easily exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments

uses a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but

with no device in the socket. The device is then inserted into the socket and a second test that measures both

the socket leakage and the device input bias current is performed. The two measurements are then subtracted

algebraically to determine the bias current of the device.

1OUT

1IN –

1IN +

VCC –

SCOUT

SCREF

OSC

SCIN

VCC +

2OUT

2IN –

2IN +

CAP –

GND

CAP +

FB/SD

COUT

0.1

µF

CIN

0.1

µF

1N4933

TLE2662

Figure 4. Test Circuit

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