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Beehive Electronics · Tel: (707) 824-9206 · info@beehive-electronics.com

rev. 2.2

8555 Lawrence Lane, Sebastopol CA 95472

Features

• An integrated electrostatic shield in the loop probes eliminates common-mode pickup.

• Multiple loop sizes offer optimum sensitivity and spatial resolution at different frequencies.

• Probe dimensions optimized for access to tight spaces.

• Calibrated sensitivity up to 3 GHz, depending on model. Usable to beyond 6 GHz.

• Can be driven by a signal source to generate fields for electromagnetic susceptibility testing.

Applications

• Finding sources of EMC emissions problems.

• Injecting fields into circuits to identify those which are EMC-susceptible.

• Noninvasive probing of RF circuits. The probes can be used to measure the signals present on an

operational PC board.

For example, using a preamplifier, the probes can measure the

characteristics of an oscillator, such as frequency, sidebands, and phase noise.

Specifications

Dimensions:

Length, excluding connector: 6.35”

Probe tip thickness: 0.11”

Table 1

Model Number

Tip Diameter (in)

Loop Diameter (in)

100C (large loop)

1.0

0.85

100A (medium loop)

0.5

0.4

100B (small loop)

0.25

0.15

100D (stub)

.08

N/A

Sensitivity:

100 A/B/C Loop Probes

The probe output power into a 50 ohm load and the magnetic flux density are related by the

following equation:

Pout = X + 20*log10(B) + 20*log10(F) , or alternatively,

20*log10(B) = Pout – X - 20*log10(F)

Where

B is the magnetic flux density, in tesla

F is the frequency of the received signal, in megahertz

Pout is the probe output power into 50 ohms, in dBm

X is a scale factor from the table below: