| Motore di ricerca datesheet componenti elettronici |
|
LMP2012QML-SP Scheda tecnica(PDF) 2 Page - Texas Instruments |
|
|
|||||||||||||||||||||||||||||
LMP2012QML-SP Scheda tecnica(HTML) 2 Page - Texas Instruments |
|
2 / 13 page ![]() LMP2012QML SNOSAU5H – MARCH 2007 – REVISED APRIL 2013 www.ti.com Absolute Maximum Ratings (1) Supply Voltage 5.8V Differential Input Voltage ±Supply Voltage Power Dissipation(2) 714mW Maximum Junction Temperature (TJmax) 150°C Common-Mode Input Voltage -0.3 ≤ VCM ≤ VCC +0.3V Current at Input Pin 30 mA Current at Output Pin 30 mA Current at Power Supply Pin 50 mA Operating Temperature Range -55°C to +125°C Storage Temperature Range -55°C to +150°C CLGA Lead Temperature (soldering 10 sec.) +260°C Thermal Resistance θJA CLGA (Still Air) 175°C/W CLGA (500LF/Min Air Flow) 115°C/W θJC CLGA 12.3°C/W Package Weight CLGA 220mg ESD Tolerance(3) 4000V (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (3) Human body model, 1.5 k Ω in series with 100 pF. Quality Conformance Inspection Table 1. Mil-Std-883, Method 5005 - Group A Subgroup Description Temp (°C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Setting time at +25 13 Setting time at +125 14 Setting time at -55 2 Submit Documentation Feedback Copyright © 2007–2013, Texas Instruments Incorporated Product Folder Links: LMP2012QML |
|
|
Link URL |
| Lei ha avuto il aiuto da alldatasheet? [ DONATE ] |
Di alldatasheet | Richest di pubblicita | contatti | Privacy Policy | Collegamento alla scheda tecnica | scambio Link | Ricerca produttore All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |