TLV2341IPWLE datasheet(43/53 Pages) TI2

43 / 53 page

TLV2341, TLV2341Y

LinCMOS

™ PROGRAMMABLE LOW-VOLTAGE

OPERATIONAL AMPLIFIERS

SLOS110A – MAY 1992 – REVISED AUGUST 1994

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

single-supply versus split-supply test circuits

Because the TLV2341 is optimized for single-supply operation, circuit configurations used for the various tests

often present some inconvenience since the input signal, in many cases, must be offset from ground. This

inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative

rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives

the same result.

–

VDD

VDD +

VDD –

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

Figure 92. Unity-Gain Amplifier

–

1/2 VDD

VDD

Ω

2 k

Ω

2 k

Ω

VDD +

VDD –

VOVO

Ω

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

Figure 93. Noise-Test Circuits

–

10 k

Ω

1/2 VDD

100

Ω

VDD

100

Ω

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

10 k

Ω

VDD +

VDD –

Figure 94. Gain-of-100 Inverting Amplifier

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