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ADS5510IPAP Scheda tecnica(PDF) 3 Page - Texas Instruments

Il numero della parte ADS5510IPAP
Spiegazioni elettronici  11-Bit, 125-MSPS Analog-To-Digital Converter
PDF  34 Pages
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Produttore elettronici  TI2 [Texas Instruments]
Homepage  https://www.ti.com
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ADS5510IPAP Scheda tecnica(HTML) 3 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS
ADS5510
SLAS499 – JANUARY 2007
Typical values given at T
A = 25°C, min and max specified over the full recommended operating temperature range, AVDD =
DRV
DD = 3.3 V, sampling rate = 125 MSPS, 50% clock duty cycle, DLL On, 3-VPP differential clock, and –1 dBFS differential
input, unless otherwise noted
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
11
bits
Analog Inputs
Differential input range
2.3
VPP
Differential input impedance
See Figure 24
6.6
k
Differential input capacitance
See Figure 24
4
pF
Analog input common-mode current
300
µA
(per input)
Analog input bandwidth
Source impedance = 50
750
MHz
Clock
Voltage overload recovery time
4
cycles
Internal Reference Voltages
V(REFM)
Reference bottom voltage
0.95
V
V(REFP)
Reference top voltage
2.1
V
Reference error
–4%
±0.9%
4%
1.55
VCM
Common-mode voltage output
V
±0.05
Dynamic DC Characteristics and Accuracy
No missing codes
Tested
DNL
Differential nonlinearity error
fIN = 10 MHz
-0.5
±0.25
0.5
LSB
INL
Integral nonlinearity error
fIN = 10 MHz
-1.5
±0.8
1.5
LSB
Offset error
-11
+2.5
+11
mV
Offset temperature coefficient
0.01
mV/
°C
∆offset error/∆AV
DD from AVDD = 3 V to
PSRR
DC power-supply rejection ratio
0.25
mV/V
AVDD = 3.6 V
Gain error (1)
-2
±0.45
+2
%FS
Gain temperature coefficient
0.01
∆%/°C
Dynamic AC Characteristics
fIN = 10 MHz
62.5
66.7
fIN = 70 MHz
66.5
SNR
Signal-to-noise ratio
fIN = 100 MHz
66.3
dBFS
fIN = 130 MHz
66
fIN = 170 MHz
65.5
fIN = 10 MHz
73
84
fIN = 70 MHz
81
SFDR
Spurious-free dynamic range
fIN = 100 MHz
82
dBc
fIN = 130 MHz
78
fIN = 170 MHz
72
fIN = 10 MHz
73
91
fIN = 70 MHz
87
HD2
Second-harmonic
fIN = 100 MHz
84
dBc
fIN = 130 MHz
79
fIN = 170 MHz
74
(1)
Gain error is specified by design and characterization; it is not tested in production.
3
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