ISO7720DR.B datasheet(29/51 Pages) TI2

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9.2.3 Application Curve

The following typical eye diagrams of the ISO772x family of devices indicate low jitter and wide open eye at the

maximum data rate of 100 Mbps.

Time = 3.5 ns / div

Figure 9-3. ISO7720 Eye Diagram at 100 Mbps

PRBS, 5-V Supplies and 25°C

Time = 3.5 ns / div

Figure 9-4. ISO7721 Eye Diagram at 100 Mbps

PRBS, 5-V Supplies and 25°C

9.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Test Setup for Insulation Lifetime Measurement

for TDDB test setup. The insulation breakdown data is collected at various high voltages switching at 60 Hz

over temperature. For reinforced insulation, VDE standard requires the use of TDDB projection line with failure

rate of less than 1 part per million (ppm). Even though the expected minimum insulation lifetime is 20 years at

the specified working isolation voltage, VDE reinforced certification requires additional safety margin of 20% for

working voltage and 50% for lifetime which translates into minimum required insulation lifetime of 30 years at a

working voltage that's 20% higher than the specified value.

Insulation Lifetime Projection Data shows the intrinsic capability of the isolation barrier to withstand high voltage

stress over its lifetime. Based on the TDDB data, the intrinsic capability of the insulation is 1500 VRMS with a

lifetime of 36 years. Other factors, such as package size, pollution degree, material group, etc. can further limit

the working voltage of the component. The working voltage of DW-16 and DWV-8 packages is specified up to

1500 VRMS and D-8 package up to 450 VRMS. At the lower working voltages, the corresponding insulation lifetime

is much longer than 36 years.

DUT

Vcc 2

Vcc 1

GND 1

GND 2

Ovenat150°C

TimeCounter

> 1 mA

Figure 9-5. Test Setup for Insulation Lifetime Measurement

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ISO7720, ISO7721

SLLSEP3G – NOVEMBER 2016 – REVISED MAY 2024

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ISO7720DR.B Scheda tecnica(PDF) 29 Page - Texas Instruments