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TLV3012 Scheda tecnica(PDF) 4 Page - Texas Instruments

Il numero della parte TLV3012
Spiegazioni elettronici  TLV3011, TLV3012, TLV3011B and TLV3012B Low-Power Comparators With Integrated 1.24 V Voltage Reference
PDF  41 Pages
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Produttore elettronici  TI2 [Texas Instruments]
Homepage  https://www.ti.com
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6 Specifications
6.1 Absolute Maximum Ratings- TLV3011 and TLV3012
Over operating free-air temperature range (unless otherwise noted)(1).
MIN
MAX
UNIT
Supply voltage
7
V
Signal input pins
Voltage(2)
–0.5
(V+) +0.5
V
Current(2)
±10
mA
Output short circuit(3)
Continuous
Operating temperature
–40
125
°C
TJ
Junction temperature
150
°C
Tstg
Storage temperature
–65
150
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2)
All voltage values are with respect to the network ground pin.
(3)
Short circuit to ground
6.2 Absolute Maximum Ratings - TLV3011B and TLV3012B
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
UNIT
Supply voltage: VS = (V+) – (V–)
–0.5
7
V
Input pins (IN+, IN–) from (V–)(2)
–0.5
7
V
Output (OUT) (Open-Drain) from (V–)(3)
–0.5
7
V
Output (OUT) (Push-Pull) from (V–)
–0.5
(V+) + 0.5
V
Output short circuit current(4)
10
mA
Junction temperature, TJ
150
°C
Storage temperature, Tstg
–65
150
°C
(1)
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2)
Input pins are diode-clamped to (V–). Inputs (IN+, IN–) can be greater than (V+) as long as within the –0.5 V to 7 V range. Inputs
beyond –0.3 V must be current-limited to less than –10 mA, while inputs beyond 7 V must be externally voltage clamped.
(3)
Output (OUT) for open drain can be greater than (V+) and inputs (IN+, IN–) as long as it is within the –0.5 V to 7 V range
(4)
Short-circuit to (V–) or (V+).
6.3 ESD Ratings
VALUE
UNIT
V(ESD)
Electrostatic
discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
V
Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2)
±1000
(1)
JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.
TLV3011, TLV3012, TLV3011B, TLV3012B
SBOS300C – FEBRUARY 2004 – REVISED APRIL 2023
www.ti.com
4
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Copyright © 2023 Texas Instruments Incorporated
Product Folder Links: TLV3011 TLV3012 TLV3011B TLV3012B



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