HCTS299HMSR datasheet(8/12 Pages) INTERSIL

Il numero della parte	HCTS299HMSR

Spiegazioni elettronici	Radiation Hardened 8-Bit Universal Shift Register; Three-State

PDF	12 Pages

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Produttore elettronici	INTERSIL [Intersil Corporation]

Homepage	http://www.intersil.com/cda/home

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HCTS299MS

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE: 1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. STATIC BURN-IN AND DYNAMIC

OPEN

GROUND

1/2 VCC = 3V

± 0.5V

VCC = 6V

± 0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

8, 17

1 - 7, 9 - 16, 18, 19

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

8, 17

1 - 7, 9, 11 - 16, 18 - 20

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

2, 3, 10, 18, 19

4 - 8, 13 - 17

1, 9, 20

NOTES:

1. Each pin except VCC and GND will have a resistor of 10k

Ω ± 5% for static burn-in

2. Each pin except VCC and GND will have a resistor of 680

Ω ± 5% for dynamic burn-in

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

± 0.5V

8, 17

1 - 7, 9, 11 - 16, 18 - 20

NOTE: Each pin except VCC and GND will have a resistor of 47K

Ω ± 5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

Spec Number

518640

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