
2
AUG-13-2004
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
P3055LSG
TO-263
Lead Free
NIKO-SEM
VDS = 20V, VGS = 0V
25
Zero Gate Voltage Drain Current
IDSS
VDS = 20V, VGS = 0V, TJ = 125 °C
250
µA
On-State Drain Current
1
ID(ON)
VDS = 10V, VGS = 10V
12
A
VGS = 5V, ID = 12A
70
120
Drain-Source On-State
Resistance
1
RDS(ON)
VGS = 10V, ID = 12A
50
90
mΩ
Forward Transconductance
1
gfs
VDS = 15V, ID = 12A
16
S
DYNAMIC
Input Capacitance
Ciss
450
Output Capacitance
Coss
200
Reverse Transfer Capacitance
Crss
VGS = 0V, VDS = 15V, f = 1MHz
60
pF
Total Gate Charge
2
Qg
15
Gate-Source Charge
2
Qgs
2.0
Gate-Drain Charge
2
Qgd
VDS = 0.5V(BR)DSS, VGS = 10V,
ID = 6A
7.0
nC
Turn-On Delay Time
2
td(on)
6.0
Rise Time
2
tr
VDS = 15V, RL = 1Ω
6.0
Turn-Off Delay Time
2
td(off)
ID ≅ 12A, VGS = 10V, RGS = 2.5Ω
20
Fall Time
2
tf
5.0
nS
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25 °C)
Continuous Current
IS
12
Pulsed Current
3
ISM
20
A
Forward Voltage
1
VSD
IF = IS, VGS = 0V
1.5
V
Reverse Recovery Time
trr
30
nS
Peak Reverse Recovery Current
IRM(REC)
IF = IS, dlF/dt = 100A / µS
15
A
Reverse Recovery Charge
Qrr
0.043
µC
1Pulse test : Pulse Width
≤ 300 µsec, Duty Cycle ≤ 2%.
2Independent of operating temperature.
3Pulse width limited by maximum junction temperature.
REMARK: THE PRODUCT MARKED WITH “P3055LSG”, DATE CODE or LOT #
Orders for parts with Lead-Free plating can be placed using the PXXXXXXG parts name.