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CS-TC02 Scheda tecnica(PDF) 1 Page - Wavelength Electronics, Inc. |
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CS-TC02 Scheda tecnica(HTML) 1 Page - Wavelength Electronics, Inc. |
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1 / 4 page ![]() © 2020 • Sales & Technical Support: (406) 587-4910 • email: sales@teamWavelength.com • web: www.teamWavelength.com Case Study CS-TC02 Rev. A Frequency-Modulated, LiDAR- Based Length and Thickness Metrology Systems February, 2020 Page 1 ABSTRACT When manufacturing optics, confirming that they meet specifications is critical. Testing can cause damage to the surfaces in accurate measurements of distance and thickness, and not all optics are testable with non-contact measurement techniques. While thickness measurement methods tend to use contact systems that damage the lens and length metrology techniques use methods that have problems with surfaces that diffuse the light, Bridger Photonics provides a solution for both thickness and length applications with a Frequency Modulated Continuous Wave (FMCW) Light Detection and Ranging (LiDAR) technique. Without contact with the optic, Bridger Photonics can measure lengths of up to 2 m and thicknesses of up to 60 mm with 1 µm precision. The FMCW LiDAR Metrology Systems provide additional benefits including three dimensional (3D) mapping with the precision and accuracy needed in laser materials processing applications and optics manufacturing. OPTICS MANUFACTURING Accurate and precise measurements are critical to testing and material identification in optics manufacturing. In any application requiring extremely accurate positions of the optics, the thickness (optical and physical) of the lens needs to be known to a very small degree of uncertainty. The most demanding applications require 1 micron or better center thickness uncertainty.1 Quick and easy, non-contact measurements can be made with new metrology systems. High accuracy, three- dimensional (3D) mapping can be achieved using specific metrology systems with multiple measurement scans over the object under test. PROBLEMS The most common way to measure the thickness of a lens is by physical contact with that lens. This invariably slightly damages the surface of the optic and requires evaluation of the extent of the damage. Damaged optics can cause problems in high-power laser applications. Imperfections in the lens or on the surface of the lens can cause damage centers.1 These can affect the beam quality of the laser and the divergence of the laser. When the damage is too great, testing results in scrapped optics. Human error also is a source of inaccuracy when manually measuring the optics using contact methods. Non-contact techniques such as low-coherence interferometry, optical coherence tomography, and laser radar can achieve high levels of resolution, but they have difficulties with diffusely scattering surfaces. This limits measurements to only polished optics with these methods. Additionally, they only work for very thin or flat optics. Many manufacturers have a need for measuring thicknesses of curved lenses. These non-contact techniques are also limited to the size of the transparent material and cannot measure the optical thickness and therefore the group index. The optical thickness is related to the phase change of light in the material and is related to the physical thickness by a factor of the group index. This can be used to identify the type of material that has been processed confirming the correct blank was used. If this is not measured alongside the physical thickness, problems can arise from manufacturing or shipping the wrong lens material. In situ measurements during laser material processing is desirable. Adding extra components to the laser setup by using a parallel measuring system, however, is costly. Being able to measure any optic easily and quickly, regardless of form or surface or material, is critical for saving manufacturers time and money. BRIDGER PHOTONICS' SOLUTION Bridger Photonics has created rapid, accurate, compact, and non-contact solutions for industrial use on any type of lens. The Thickness Metrology Station (TMS) ( Figure 1) can measure the physical thickness, optical thickness, and group index of the material, solving identification and confirmation problems. The Length Metrology System (LMS) ( Figure 2) is designed with a compact optical probe to make integration into any system simple. It is specifically designed for laser materials processing systems. |
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