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CS-TC02 Scheda tecnica(PDF) 1 Page - Wavelength Electronics, Inc.

Il numero della parte CS-TC02
Spiegazioni elettronici  Frequency-Modulated, LiDAR-Based Length and Thickness Metrology Systems
PDF  4 Pages
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Produttore elettronici  WAVELENGTH [Wavelength Electronics, Inc.]
Homepage  https://www.teamwavelength.com/
Logo WAVELENGTH - Wavelength Electronics, Inc.

CS-TC02 Scheda tecnica(HTML) 1 Page - Wavelength Electronics, Inc.

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© 2020 • Sales & Technical Support: (406) 587-4910 • email: sales@teamWavelength.com • web: www.teamWavelength.com
Case Study CS-TC02 Rev. A
Frequency-Modulated, LiDAR-
Based Length and Thickness
Metrology Systems
February, 2020
Page 1
ABSTRACT
When manufacturing optics, confirming that they meet specifications is critical. Testing can cause
damage to the surfaces in accurate measurements of distance and thickness, and not all optics are
testable with non-contact measurement techniques. While thickness measurement methods tend to use
contact systems that damage the lens and length metrology techniques use methods that have problems
with surfaces that diffuse the light, Bridger Photonics provides a solution for both thickness and length
applications with a Frequency Modulated Continuous Wave (FMCW) Light Detection and Ranging
(LiDAR) technique. Without contact with the optic, Bridger Photonics can measure lengths of up to 2 m
and thicknesses of up to 60 mm with 1 µm precision. The FMCW LiDAR Metrology Systems provide
additional benefits including three dimensional (3D) mapping with the precision and accuracy needed in
laser materials processing applications and optics manufacturing.
OPTICS MANUFACTURING
Accurate and precise measurements are critical to testing
and material identification in optics manufacturing. In any
application requiring extremely accurate positions of the
optics, the thickness (optical and physical) of the lens
needs to be known to a very small degree of uncertainty.
The most demanding applications require 1 micron or better
center thickness uncertainty.1
Quick and easy, non-contact measurements can be
made with new metrology systems. High accuracy, three-
dimensional (3D) mapping can be achieved using specific
metrology systems with multiple measurement scans over
the object under test.
PROBLEMS
The most common way to measure the thickness of a lens
is by physical contact with that lens. This invariably slightly
damages the surface of the optic and requires evaluation
of the extent of the damage. Damaged optics can cause
problems in high-power laser applications. Imperfections in
the lens or on the surface of the lens can cause damage
centers.1 These can affect the beam quality of the laser and
the divergence of the laser. When the damage is too great,
testing results in scrapped optics. Human error also is a
source of inaccuracy when manually measuring the optics
using contact methods.
Non-contact
techniques
such
as
low-coherence
interferometry, optical coherence tomography, and laser
radar can achieve high levels of resolution, but they have
difficulties with diffusely scattering surfaces. This limits
measurements to only polished optics with these methods.
Additionally, they only work for very thin or flat optics. Many
manufacturers have a need for measuring thicknesses
of curved lenses. These non-contact techniques are
also limited to the size of the transparent material and
cannot measure the optical thickness and therefore
the group index. The optical thickness is related to the
phase change of light in the material and is related to the
physical thickness by a factor of the group index. This
can be used to identify the type of material that has been
processed confirming the correct blank was used. If this is
not measured alongside the physical thickness, problems
can arise from manufacturing or shipping the wrong lens
material.
In situ measurements during laser material processing
is desirable. Adding extra components to the laser setup
by using a parallel measuring system, however, is costly.
Being able to measure any optic easily and quickly,
regardless of form or surface or material, is critical for
saving manufacturers time and money.
BRIDGER PHOTONICS' SOLUTION
Bridger Photonics has created rapid, accurate, compact,
and non-contact solutions for industrial use on any type of
lens. The Thickness Metrology Station (TMS) (
Figure 1)
can measure the physical thickness, optical thickness,
and group index of the material, solving identification and
confirmation problems. The Length Metrology System
(LMS) (
Figure 2) is designed with a compact optical probe
to make integration into any system simple. It is specifically
designed for laser materials processing systems.


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