9DB433

FOUR OUTPUT DIFFERENTIAL BUFFER FOR PCIE GEN1–3

IDT®

FOUR OUTPUT DIFFERENTIAL BUFFER FOR PCIE GEN1–3

4

9DB433

MAY 25, 2018

Absolute Maximum Ratings

Stresses above the ratings listed below can cause permanent damage to the 9DB433. These ratings, which are standard

values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other

conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute

maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over

the recommended operating temperature range.

Electrical Characteristics–DIF 0.7V Current Mode Differential Outputs

PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNITS NOTES

3.3V Core Supply Voltage

VDDA/R

4.6

V

1,2

3.3V Logic Supply Voltage

VDD

4.6

V

1,2

Input Low Voltage

VIL

GND-0.5

V

1

Input High Voltage

VIH

Except for SMBus interface

VDD+0.5V

V

1

Input High Voltage

VIHSMB

SMBus clock and data pins

5.5V

V

1

Storage Temperature

Ts

-65

150

°C

1

Junction Temperature

Tj

125

°C

1

Input ESD protection

ESD prot

Human Body Model

2000

V

1

1Guaranteed by design and characterization, not 100% tested in production.

2 Operation under these conditions is neither implied nor guaranteed.

TA = TCOM or TIND; Supply Voltage VDD = 3.3 V +/-5%

PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNITS NOTES

Slew rate

Trf

Scope averaging on

1.5

2.8

4

V/ns

1, 2, 3

Slew rate matching

∆Trf

Slew rate matching, Scope averaging on

8

20

%

1, 2, 4

Voltage High

VHigh

660

797

850

1

Voltage Low

VLow

-150

14

150

1

Max Voltage

Vmax

813

1150

1

Min Voltage

Vmin

-300

-1

1

Vswing

Vswing

Scope averaging off (Differential)

300

1596.9

mV

1, 2

Crossing Voltage (abs)

Vcross_abs

Scope averaging off

250

378

550

mV

1, 5

Crossing Voltage (var)

∆-Vcross

Scope averaging off

16

140

mV

1, 6

2 Measured from differential waveform

6 The total variation of all Vcross measurements in any particular system. Note that this is a subset of V_cross_min/max (V_cross

absolute) allowed. The intent is to limit Vcross induced modulation by setting V_cross_delta to be smaller than V_cross absolute.

mV

Statistical measurement on single-ended signal

using oscilloscope math function. (Scope

averaging on)

Measurement on single ended signal using

absolute value. (Scope averaging off)

mV

1Guaranteed by design and characterization, not 100% tested in production. IREF = VDD/(3xR

R).

For RR = 475Ω (1%), IREF = 2.32mA.

IOH = 6 x IREF and VOH = 0.7V @ ZO=50Ω (100Ω differential impedance).

3 Slew rate is measured through the Vswing voltage range centered around differential 0V. This results in a +/-150mV window around

differential 0V.

4 Matching applies to rising edge rate for Clock and falling edge rate for Clock#. It is measured using a +/-75mV window centered on

the average cross point where Clock rising meets Clock# falling. The median cross point is used to calculate the voltage thresholds the

oscilloscope is to use for the edge rate calculations.

5 Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising

edge (i.e. Clock rising and Clock# falling).