4

4816ES–DAB–01/07

ATR2740 [Preliminary]

Electrostatic sensitive device.

Observe precautions for handling.

2.

Absolute Maximum Ratings

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating

only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this

specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Parameters

Symbol

Min.

Max.

Unit

Operating free air temperature range for LQFP128

–40

+85

°C

Operating free air temperature range for BGA121

–10

+70

°C

Storage temperature

T

Stg

–60

+150

°C

DC supply voltage

VDD18

–0.3

+1.95

V

VDD33

–0.3

+3.6

V

AVDD

–0.3

+3.6

V

DC input voltage

–0.3

+1.95

V

Notes:

1. The part may not survive if all maximums are applied simultaneously.

3.

DC Electrical Characteristics

No.

Parameters

Test Conditions

Pin

Symbol

Min.

Typ.

Max.

Unit

Type*

1.1

DC supply voltage

VDD18

1.65

1.8

1.95

V

1.2

Low-level input

voltage

VDD18 = 1.65 to 1.95V

–0.3

+0.3

×

VDD18

V

1.3

High-level input

voltage

VDD18 = 1.65 to 1.95V

+0.7

×

VDD18

VDD18

+ 0.3

V

1.4

Low-level output

voltage

VDD18 = 1.65V

V

OL

0.1

V

1.5

High-level output

voltage

VDD18 = 1.65V

VDD18

– 0.1

V

1.12

Crystal oscillator

frequency

24.576

MHz

1.13

Clock duty cycle

40

60

%

1.15

USB DC supply

voltage

Full speed

VDD33

3

3.3

3.6

V

1.16

USB input low level

VILUSB

0.8

V

1.17

USB input high level

VIHUSB

2.0

V

1.18

USB differential input

sensitivity

VDIUSB

0.2

V

1.19

USB differential input

common mode range

VCMUSB

0.8

2.5

V

*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter