74HC_HCT174

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© NXP Semiconductors N.V. 2016. All rights reserved.

Product data sheet

Rev. 4 — 12 May 2016

10 of 17

NXP Semiconductors

74HC174; 74HCT174

Hex D-type flip-flop with reset; positive-edge trigger

Table 8.

Measurement points

Type

Input

Output

VI

VM

VM

74HC174

VCC

0.5VCC

0.5VCC

74HCT174

3 V

1.3 V

1.3 V

Test data is given in Table 9.

Definitions for test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch

Fig 8.

Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPHL, tPLH

74HC174

VCC

6ns

15pF, 50 pF

1k



open

74HCT174

3V

6ns

15pF, 50 pF

1k



open